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    Focused ion beam preparation of microbeams for in situ mechanical analysis of electroplated nanotwinned copper with probe type indenters

    Focused ion beam preparation of microbeams for in situ mechanical analysis of electroplated nanotwinned copper with probe type indenters by Stuart Robertson, Scott Doak, Fu-Long Sun, Zhi-Quan Liu, Changqing Liu, Zhaoxia Zhou

    Published 2020
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