Author | Popularity |
Alvesson, Mats, 1956- |
10 |
Willmott, Hugh |
10 |
Arnold, Matthew, 1822-1888 |
6 |
West, Michael A. |
6 |
Arnot, Madeleine |
5 |
West, Michael A., 1951- |
5 |
American Society for Testing and Materials |
4 |
Weiner, Gaby |
4 |
Wrathall, Mark A. |
4 |
Boyer, Mark A. |
3 |
Institute of Electrical and Electronics Engineers |
3 |
Palladino, Michael Angelo |
3 |
Pollack, Mark A., 1966- |
3 |
Starkey, Brigid, 1962- |
3 |
Thieman, William J. |
3 |
Wahab, Magd Abdel |
3 |
Wallace, Helen (Helen S.) |
3 |
Wallach, M. A. |
3 |
Wani, M. A. (M. Arif) |
3 |
Watson, Mary Ann |
3 |
Weiner, Michael A. |
3 |
Weinstein, Michael A. |
3 |
Wilkenfeld, Jonathan |
3 |
Young, Alasdair R. |
3 |
ASTM Committee E-47 on Biological Effects and Environmental Fate |
2 |
ASTM International |
2 |
Ainscow, Mel |
2 |
Albright, Madeleine |
2 |
Allen, Melanie |
2 |
Alrutz, Megan |
2 |
Ambroz, Miroslav |
2 |
Ashley, Michael |
2 |
Association for Machine Learning and Applications |
2 |
Atwood, Margaret, 1939- |
2 |
Bear, Mark F. |
2 |
Bruton, Garry D. |
2 |
Cave, William M. |
2 |
Chesler, Mark A. |
2 |
Collins, M. W. |
2 |
Connors, Barry W. |
2 |
David, Miriam E., 1945- |
2 |
Dreyfus, Hubert L. |
2 |
Dunn, Waldo Hilary |
2 |
Fligner, Michael A. |
2 |
Fry, William F |
2 |
Gao, Wen |
2 |
Geoff K. Folkard |
2 |
Hopkins, David, 1949- |
2 |
IEEE Xplore (Online service) |
2 |
Ikon Gallery |
2 |