Bayesian Estimation for Spectral Deconvolution by Nagata, Kenji

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Observation of Pt-NiO1-x nanostructure formation on Pt3Ni(111) surface with ambient pressure XPS and STM by Mun, Bongjin Simon

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Towards standardising electron spectroscopy measurement of nanoparticle coatings by Cant, David, Clifford, Charles, Shard, Alex, Müller, Anja, Unger, Wolfgang

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Near Ambient Pressure X-ray Photoelectron Spectroscopy (NAP-XPS). Characterization of Non-Traditional Materials with the SPECS EnviroESCA Instrument by Patel, Dhananjay I., Dietrich, Paul, Thißen, Andreas, Linford, Matthew R.

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A Multi-Technique Approach for a Complete Thin Film Characterisation by Gerrard, N., Counsell, J., Roberts, A., Blomfield, C., Moffitt, C., Conard, T.

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Chemical State Quantification of X-ray Auger Electron Spectrum with Top-Hat Filtering by Kajiwara, Yasuko, Kinoshita, Mayu, Oyama, Takashi

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Guide of SESSA for Electron Spectroscopy by Miura, Kaoru, Yoshikawa, Hideki

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Errata to “Auger Electron Spectroscopy Analysis of W diffused from WC Grain into Co Regions in Cutting Tools” [J. Surf. Anal. 21, 2-9 (2014)] by Okumura, Hiroshi, Mine, Kazuhisa

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The Basis of AES/XPS/SIMS by Yoshihara, Kazuhiro

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New Development of Depth Profiling in XPS by Tomizuka, Hitoshi, Machida, Masatake, Oiwa, Retsu

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Ability in Surface Analysis of Soft X-ray XAFS taken with the Fluorescence Yield Mode —— Probing Depth and Self-Absorption Correction Method by Usuki, Noriaki, Ito, Akiko, Adadhi, Takeharu, Hayamizu, Hiroko, Yamanaka, Keisuke

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Study on metal oxide surfaces for dye-sensitized solar cells by photoelectron spectroscopy and analyses using photoelectron diffraction and holography by Shimomura, Masaru, Kondo, Atsuyoshi, Endo, Raimu

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Electron microprobe analysis of Mg-Ge alloy - Examination of the mass absorption coefficient of Ge for Mg Kα by Nishio, Mitsuaki, Yosyikawa, Hideki, Tanuma, Shigeo, Imai, Motoharu, Isoda, Yukihiro

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セグメント回帰を用いたべき乗則で解釈される スペクトルの前処理法 by 柳⽣, 進⼆郎, 吉武, 道⼦, ⻑⽥, 貴弘

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ガス吸着実験の軌跡 by 阿部, 芳巳

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EBSD による銅板の動的その場観察 ―引張り・圧縮・曲げおよび加熱 by 麻生, 昭弘, 木村, 昌弘

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How is the Signal Attenuation in Surface Electron Spectroscopy Described?: VI. The calculation of the squares of the dipole matrix ele¬ments in elemental solids and the IMFPs by the Penn algorithm by Tanuma, Shigeo, Shinotsuka, Hiroshi

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表面化学分析に関わる用語解説（TASSAのたまご）第8回 by 標準化活動部会

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カーボン系電池材料のXPS帯電中和方法の検討 by 鈴⽊, 貴博, 鴨藤, 加奈, 飯島, あゆみ, 塚本, 和芳, ⼤⽯, 隼輔

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表面電子分光法における信号の減衰は如何に記述されるか: VI. 元素における双極子行列要素平方の計算とPenn algorithmによるIMFPの計算 by 田沼, 繁夫, 篠塚, 寛志

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