Search Results - 刘惠珍 盛康龙 朱德彰 杨国华 朱福英 曹建清 唐立军

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    THE DAMAGE MEASUREMENT OF ION- IMPLANTED COMPOUND SEMICONDUCTOR GaAs BY PIXE-CHANNELING TECHNIQUE

    THE DAMAGE MEASUREMENT OF ION- IMPLANTED COMPOUND SEMICONDUCTOR GaAs BY PIXE-CHANNELING TECHNIQUE by 刘惠珍 盛康龙 朱德彰 杨国华 朱福英 曹建清 唐立军

    Published in 核技术：英文版
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