Search Results - 吕伟锋 王光义 林弥 孙玲玲

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    Statistical Modeling of Gate Capacitance Variations Induced by Random Dopants in Nanometer MOSFETs Reserving Correlations

    Statistical Modeling of Gate Capacitance Variations Induced by Random Dopants in Nanometer MOSFETs Reserving Correlations by 吕伟锋 王光义 林弥 孙玲玲

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