Search Results - 封国强 上官士鹏 马英起 韩建伟

  • Showing 1 - 2 results of 2
Refine Results
  1. 1
    SEE characteristics of small feature size devices by using laser backside testing

    SEE characteristics of small feature size devices by using laser backside testing by 封国强 上官士鹏 马英起 韩建伟

    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  2. 2
    Comparative research on ＂high currents＂ induced by single event latch-up and transient-induced latch-up

    Comparative research on ＂high currents＂ induced by single event latch-up and transient-induced latch-up by 陈睿 韩建伟 郑汉生 余永涛 上官士鹏 封国强 马英起

    Published in Chinese physics B
    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:

Search Tools: