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Search Results - 荻原, 俊弥
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極低角度入射イオンビームを用いたオージェ深さ方向分析によるFeNi/CoFeB/FeNi多層薄膜の分析
by
荻原, 俊弥
,
柳内, 克昭
,
吉川, 英樹
Published in
Journal of Surface Analysis
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極低角度入射ビームオージェ深さ方向分析によるHfO2/Si基板の分析
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荻原, 俊弥
,
長田, 貴弘
,
吉川, 英樹
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Journal of Surface Analysis
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半球型電子分光器を搭載したオージェ電子分光装置のジオメトリー特性に基づいた傾斜ホルダーを利用した高感度,高深さ分解能オージェ深さ方向分析...
by
荻原, 俊弥
,
永富, 隆清
,
金, 慶中
,
田沼, 繁夫
Published in
Journal of Surface Analysis
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Journal Of Surface Analysis
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Auger Depth Profiling Analysis
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Ultra Low Angle Incidence Ion Beam
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Feni/Cofeb/Feni Thin Film
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Hfo2/Si
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Full-Text Journals In Chemistry (Open Access)
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J-Stage Free Content
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