Search Results - 赵琳娜 于沛洪 郭子骧 闫大为 周浩 吴锦波 崔志强 孙华锐 顾晓峰

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    Progressive current degradation and breakdown behavior in GaN LEDs under high reverse bias stress

    Progressive current degradation and breakdown behavior in GaN LEDs under high reverse bias stress by 赵琳娜 于沛洪 郭子骧 闫大为 周浩 吴锦波 崔志强 孙华锐 顾晓峰

    Published in Chinese physics B
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