High-speed atomic force microscopy in liquid by Sulchek, T., Hsieh, R., Adams, J. D., Minne, S. C., Quate, C. F., Adderton, D. M.

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Dual integrated actuators for extended range high speed atomic force microscopy by Sulchek, T., Minne, S. C., Adams, J. D., Fletcher, D. A., Atalar, A., Quate, C. F., Adderton, D. M.

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High-speed tapping mode imaging with active Q control for atomic force microscopy by Sulchek, T., Hsieh, R., Adams, J. D., Yaralioglu, G. G., Minne, S. C., Quate, C. F., Cleveland, J. P., Atalar, A., Adderton, D. M.

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Scanning capacitance microscopy for carrier profiling in semiconductors by ERICKSON, A. N, ADDERTON, D. M, STRAUSSER, Y. E, TENCH, R. J

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Electrostatic Force Spectroscopy and Imaging of Bi Wires: Spatially Resolved Quantum Confinement by Gekhtman, D., Zhang, Z. B., Adderton, D., Dresselhaus, M. S., Dresselhaus, G.

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Quantitative scanning capacitance microscopy analysis of two-dimensional dopant concentrations at nanoscale dimensions by ERICKSON, A, SADWICK, L, NEUBAUER, G, KOPANSKI, J, ADDERTON, D, ROGERS, M

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