Recombination by grain-boundary type in CdTe by Moseley, John, Metzger, Wyatt K., Moutinho, Helio R., Paudel, Naba, Guthrey, Harvey L., Yan, Yanfa, Ahrenkiel, Richard K., Al-Jassim, Mowafak M.

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Minority Carrier Lifetime Analysis in the Bulk of Thin-Film Absorbers Using Subbandgap (Two-Photon) Excitation by Kuciauskas, Darius, Kanevce, Ana, Burst, James M., Duenow, Joel N., Dhere, Ramesh, Albin, David S., Levi, Dean H., Ahrenkiel, Richard K.

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Cathodoluminescence Analysis of Grain Boundaries and Grain Interiors in Thin-Film CdTe by Moseley, John, Al-Jassim, Mowafak M., Kuciauskas, Darius, Moutinho, Helio R., Paudel, Naba, Guthrey, Harvey L., Yanfa Yan, Metzger, Wyatt K., Ahrenkiel, Richard K.

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A new lifetime diagnostic system for photovoltaic materials by AHRENKIEL, Richard K, DUNLAVY, Donald J

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Resonant coupling for contactless measurement of carrier lifetime by Ahrenkiel, Richard K.

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Resonant coupling for contactless measurement of carrier lifetime by Ahrenkiel, Richard K., Johnston, Steven W.

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Erratum: “Resonant coupling for contactless measurement of carrier lifetime” [J. Vac. Sci. Technol. B 31, 04D113 (2013)] by Ahrenkiel, Richard K.

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Nanocrystal formation in annealed a-SiO0.17N0.07:H films by Kohli, Sandeep, Theil, Jeremy A, Dippo, Patricia C, Jones, K M, Al-Jassim, Mowafak M, Ahrenkiel, Richard K, Rithner, Christopher D, Dorhout, Peter K

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Spectroscopic ellipsometry and photoluminescence measurements of as-deposited and annealed silicon rich oxynitride films by Kohli, Sandeep, Theil, Jeremy A., McCurdy, Patrick R., Dippo, Patricia C., Ahrenkiel, Richard K., Rithner, Christopher D., Dorhout, Peter K.

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Chemical, optical, vibrational and luminescent properties of hydrogenated silicon-rich oxynitride films by Kohli, Sandeep, Theil, Jeremy A., Dippo, Patricia C., Ahrenkiel, Richard K., Rithner, Christopher D., Dorhout, Peter K.

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Cathodoluminescence spectrum imaging analysis of CdTe thin-film bevels by Moseley, John, Al-Jassim, Mowafak M., Guthrey, Harvey L., Burst, James M., Duenow, Joel N., Ahrenkiel, Richard K., Metzger, Wyatt K.

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Cathodoluminescence spectrum imaging analysis of CdTe thin-film bevels by Moseley, John, Al-Jassim, Mowafak M., Guthrey, Harvey L., Burst, James M., Duenow, Joel N., Ahrenkiel, Richard K., Metzger, Wyatt K.

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Effect of sodium doping on graded Cu(In1−xGax)Se2 thin films prepared by chemical spray pyrolysis by Babu, B.J., Velumani, S., Simonds, Brian J., Ahrenkiel, Richard K., Kassiba, A., Asomoza, R.

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Recombination by grain-boundary type in CdTe by Moseley, John, Ahrenkiel, Richard K., Colorado School of Mines, 1500 Illinois Street, Golden, Colorado 80401, Metzger, Wyatt K., Moutinho, Helio R., Guthrey, Harvey L., Al-Jassim, Mowafak M., Paudel, Naba, Yan, Yanfa

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Modeling minority-carrier lifetime techniques that use transient excess-carrier decay by Johnston, Steven W., Berman, Gregory M., Ahrenkiel, Richard K.

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Space charge limited current effect on photoconductive decay in silicon at high injection levels by Feldman, A D, Ahrenkiel, R K

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Applications of imaging techniques for solar cell characterization by Johnston, S.W., Call, N.J., Phan, B., Ahrenkiel, R.K.

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A new method to analyze multiexponential transients for deep-level transient spectroscopy by HANAK, T. R, AHRENKIEL, R. K, DUNLAVY, D. J, BAKRY, A. M, TIMMONS, M. L

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Generation rate dependence of carrier lifetime measurements in nanocrystalline silicon using transmission modulated photoconductive decay by Simonds, B J, Baojie Yan, Guozhen Yue, Ahrenkiel, R K, Taylor, P C

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Imaging of shunts and junction breakdown in multicrystalline silicon solar cells by Call, N.J., Johnston, S.W., Ahrenkiel, R.K., Romero, M.J., Yang, B.

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