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On the profile of frequency and voltage dependent interface states and series resistance in (Ni/Au)/Al0.22Ga0.78N/AlN/GaN heterostructures by using current―voltage (I―V) and admitt...
by
DEMIREZEN, S
,
ALTIINDAL, S
,
ÖZCELIK, S
,
ÖZBAY, E
Published in
Microelectronics and reliability
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