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Electrical and optical characterization of back-to-back Schottky (Al,Ga)As/NiAl/(Al,Ga)As molecular beam epitaxially grown double-heterostructure diodes
by
CHEEKS, T. L
,
SANDS, T
,
ANHORY, R. E
,
HARBISON, J
,
TABATABAIE, N
,
GILCHRIST, H. L
,
WILKENS, B. J
,
KERAMIDAS, V. G
Published in
Applied physics letters
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