Search Results - Abdollahian, Ayub

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  1. 1
    An Efficient Supervised Learning Method to Predict Power Supply Noise During At-speed Test

    An Efficient Supervised Learning Method to Predict Power Supply Noise During At-speed Test by Mozaffari, Seyed Nima, Bhaskaran, Bonita, Narayanun, Kaushik, Abdollahian, Ayub, Pagalone, Vinod, Sarangi, Shantanu, Colburn, Jonathon E.

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  2. 2
    A programmable method for low-power scan shift in SoC integrated circuits

    A programmable method for low-power scan shift in SoC integrated circuits by Ran Wang, Bhaskaran, Bonita, Natarajan, Karthikeyan, Abdollahian, Ayub, Narayanun, Kaushik, Chakrabarty, Krishnendu, Sanghani, Amit

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  3. 3
    A Novel Graph Coloring Based Solution for Low-Power Scan Shift

    A Novel Graph Coloring Based Solution for Low-Power Scan Shift by Gupta, Saurabh, Bhaskaran, Bonita, Sarangi, Shantanu, Abdollahian, Ayub, Dworak, Jennifer

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  4. 4
    Test method and scheme for low-power validation in modern SOC integrated circuits

    Test method and scheme for low-power validation in modern SOC integrated circuits by Bhaskaran, Bonita, Sanghani, Amit, Narayanun, Kaushik, Abdollahian, Ayub, Laknaur, Amit

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  5. 5
    Advanced test methodology for complex SoCs

    Advanced test methodology for complex SoCs by Kumar Datla Jagannadha, Pavan, Yilmaz, Mahmut, Sonawane, Milind, Chadalavada, Sailendra, Sarangi, Shantanu, Bhaskaran, Bonita, Abdollahian, Ayub

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  6. 6
    At-speed capture global noise reduction & low-power memory test architecture

    At-speed capture global noise reduction & low-power memory test architecture by Bhaskaran, Bonita, Chadalavada, Sailendra, Sarangi, Shantanu, Valentine, Nithin, Nerallapally, Venkat Abilash Reddy, Abdollahian, Ayub

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  7. 7
    A Novel Graph-Coloring-Based Solution for Low-Power Scan Shift

    A Novel Graph-Coloring-Based Solution for Low-Power Scan Shift by Gupta, Saurabh, Bhaskaran, Bonita, Sarangi, Shantanu, Abdollahian, Ayub, Dworak, Jennifer

    Published in IEEE design and test
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