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Investigation of scanning electron beam parameters in terms of the disk-charged approximation for the sample potential
by
Al-Obaidi, Hassan N.
,
Abid, Musatfa M.
,
Kadhem, Wasan J.
Published in
Optik (Stuttgart)
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Optik
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Approximation
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Beam Currents
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Beams
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Disc-Charged Potential
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Electron Mirror Images Beam Current
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Equations Of Motion
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Optics
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Physical Sciences
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Scanning
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Scanning Electron Microscope
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Scanning Electron Microscopy
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Science & Technology
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Trapped Charges
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Sciencedirect Freedom Collection 2022-2024
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