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Search Results - Abidin, Abdul Rashid Bin Zainal
Search Results - Abidin, Abdul Rashid Bin Zainal
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Final report on the APMP comparison of capacitance at 100 pF (APMP supplementary comparison APMP.EM-S7)
by
Johnson, Leigh
,
Chua, Wey
,
Corney, Andrew
,
Hsu, Jimmy
,
Sardjono, Hadi
,
Lee, Rae Duk
,
Zhonghua, Zhang
,
Charoensook, Ajchara
,
Coogan, Peter
,
Nakamura, Yasuhiro
,
Moodley, Alan
,
Saxena, A K
,
Yan, Y K
,
Abidin, Abdul Rashid Bin Zainal
,
Lee, Jinni
,
Semenov, Yuri
Published in
Metrologia
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APMP International Comparison of AC-DC Transfer Standards at the Lowest Attainable Level of Uncertainty
by
Budovsky, I.
,
Abdul Rashid Bin Zainal Abidin
,
Yan, Y.K.
,
Liu Lingxiang
,
Rustagi, V.K.
,
Govil, A.K.
,
Klonz, M.
,
Yih-cheng Wei
,
Early, M.
,
Sasaki, H.
,
Fujiki, H.
,
Kumtawee, C.
,
Sung-Won Kwon
,
Nguyen Anh Son
,
Suprianto, B.
,
Temba, M.
,
Ruiz, M.
,
Leones, S.P.B.
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Final report on the APMP comparison of capacitance at 10 pF: APMP.EM-K4.1
by
Johnson, Leigh
,
Chua, Wey
,
Corney, Andrew
,
Hsu, Jimmy
,
Sardjono, Hadi
,
Lee, Rae Duk
,
Zhonghua, Zhang
,
Charoensook, Ajchara
,
Coogan, Peter
,
Nakamura, Yasuhiro
,
Moodley, Alan
,
Saxena, A K
,
Yan, Y K
,
Abidin, Abdul Rashid Bin Zainal
,
Lee, Jinni
,
Semenov, Yuri
Published in
Metrologia
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APMP international comparison of AC-DC transfer standards at the lowest attainable level of uncertainty
by
Budovsky, I.
,
Abidin, A.R.B.Z.
,
Yan, A.Y.K.
,
LingXiang Liu
,
Rustagi, V.K.
,
Govil, A.K.
,
Klonz, M.
,
Yih-cheng Wei
,
Early, M.D.
,
Sasaki, H.
,
Fujiki, H.
,
Kumtawee, C.
,
Charoensook, A.
,
Sung-Won Kwon
,
Son, N.A.
,
Suprianto, B.
,
Temba, M.
,
Ruiz, M.
,
Leones, S.P.B.
Published in
IEEE transactions on instrumentation and measurement
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Final report on the APMP comparison of capacitance at 10 pF: APMP.EM-K4.1
by
Johnson, Leigh
,
Chua, Wey
,
Corney, Andrew
,
Hsu, Jimmy
,
Sardjono, Hadi
,
Lee, Rae Duk
,
Zhonghua, Zhang
,
Charoensook, Ajchara
,
Coogan, Peter
,
Nakamura, Yasuhiro
,
Moodley, Alan
,
Saxena, A K
,
Yan, Y K
,
Abidin, Abdul Rashid Bin Zainal
,
Lee, Jinni
,
Semenov, Yuri
Published in
Metrologia
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