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In-field test solution for enhancing safety in automotive applications
by
Abotbol, Yehonatan
,
Dror, Shahar
,
Tshagharyan, Grigor
,
Harutyunyan, Gurgen
,
Zorian, Yervant
Published in
Microelectronics and reliability
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Virtual Memory Structures Facilitating Memory BIST Insertion In Complex SoCs
by
Kogan, Tal
,
Abotbol, Yehonatan
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