Evaluation of Surface Roughness and Cutting Temperature of EN31 Steel with Varying MQSL Parameters by Chary Nalband, Sai Kiran, Pamidimukkala, Kalyan, Akkapally, Prathik, Challa, Muralidhar Reddy, Kirupakaran, Yeshwanth Prasanna, Dammu, Hitesh, Thati, Ajay, Abraham, Sachin Jacob, Gunda, Rakesh Kumar

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Effect of heat treatment on microstructure and wear properties on Binder Jetting Additive manufactured M2 High-Speed steel by Anoop, F.R., Abraham Jacob, Bijo, Kuriachen, Basil, Malgave, Sachin

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Prehospital Factors Associated with Delayed Hospital Arrival of Stroke Patients: A Regional Single-Center Study from India by Edakkattil, Sachin, Abraham, Siju V, Panattil, Neenu J, Gafoor, Faris A, Jacob, Leenus, Liu, Renyu

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Calibration Enabled Scalable Current Sensor Module for Quiescent Current Testing by Dasnurkar, Sachin Dileep, Abraham, Jacob A.

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Molecular basis of Wiskott-Aldrich syndrome in patients from India by David, Sachin, Jayandharan, Giridhara Rao, Abraham, Aby, Jacob, Rintu R, Devi, Govindanattar Sankari, Patkar, Nikhil, Shaji, Ramachandran V, Nair, Sukesh C, Viswabandya, Auro, Ahmed, Rayaz, George, Biju, Mathews, Vikram, Chandy, Mammen, Srivastava, Alok

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Molecular basis of W iskott– A ldrich syndrome in patients from India by David, Sachin, Jayandharan, Giridhara Rao, Abraham, Aby, Jacob, Rintu R, Devi, Govindanattar Sankari, Patkar, Nikhil, Shaji, Ramachandran V, Nair, Sukesh C, Viswabandya, Auro, Ahmed, Rayaz, George, Biju, Mathews, Vikram, Chandy, Mammen, Srivastava, Alok

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Hybrid BiST solution for Analog to Digital Converters with low-cost Automatic Test Equipment compatibility by Dasnurkar, S., Abraham, J.A.

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Real-time dynamic hybrid BiST solution for Very-Low-Cost ATE production testing of A/D converters with controlled DPPM by Dasnurkar, Sachin D, Abraham, Jacob A

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PLL lock time prediction and parametric testing by lock waveform characterization by Dasnurkar, Sachin Dileep, Abraham, Jacob A

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Calibration-enabled scalable built-in current sensor compatible with very low cost ATE by Dasnurkar, Sachin Dileep, Abraham, Jacob A

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Frequency-Independent Parametric Built in Test Solution for PLLs with Low Speed Test Resources by Dasnurkar, S. D., Abraham, J. A.

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Characterization and testing of microelectromechnical accelerometers by Dasnurkar, S., Abraham, J.

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Vector based Analog to Digital Converter sequential testing methodology to minimize ATE memory and analysis requirements by Dasnurkar, S.D., Abraham, J.A.

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Closed-loop Built in Self Test for PLL production testing with minimal tester resources by Dasnurkar, S., Abraham, J.

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Arbitrary Waveform Generator Response Shaping Method to Enable ADC Linearity Testing on Very Low Cost Automatic Test Equipment by Dasnurkar, S. D., Abraham, J. A.

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