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A systemic comparison between using augmented data and synthetic data as means of enhancing wafermap defect classification
by
Alqudah, Rajaa
,
Al-Mousa, Amjed A.
,
Abu Hashyeh, Yazan
,
Alzaibaq, Omar Z.
Published in
Computers in industry
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Computers In Industry
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Augmented Data
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Classification
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Computer Science
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Computer Science, Interdisciplinary Applications
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Data Augmentation
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Defect
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Machine Learning
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Science & Technology
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Synthetic Data
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Technology
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Wafermap
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Wm-811K
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Yield
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Sciencedirect
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Sciencedirect Freedom Collection
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Backfile Package - Computer Science (Legacy) [Ycs]
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Elsevier Sd Backfile Engineering And Technology
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