Search Results - Abys, Joe

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    Residual Stress Properties of Nickel and Copper Deposits Used for C4 Interconnects

    Residual Stress Properties of Nickel and Copper Deposits Used for C4 Interconnects by Arvin, Charles L., Scott, George, Goldsmith, Charles, Parks, Christopher, Wang, Chen, Zhang, Yun, Abys, Joe, Takahashi, Ken

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    Considerations for the long term reliability of PCBs in harsh environmental conditions

    Considerations for the long term reliability of PCBs in harsh environmental conditions by Kenny, Jim, Wengenroth, Karl, Abys, Joe, Mui, Marco, Wynschenk, Jo

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