Oxidative stress related markers in the “VITA” and the centenarian projects by Grünblatt, E., Schlößer, R., Fischer, P., Fischer, M.O., Li, J., Koutsilieri, E., Wichart, I., Sterba, N., Rujescu, D., Möller, H.J., Adamcyk, W., Dittrich, B., Müller, F., Oberegger, K., Gatterer, G., Jellinger, K.J., Mostafaie, N., Jungwirth, S., Huber, K., Tragl, K.H., Danielczyk, W., Riederer, P.

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Excitons bound to nitrogen pairs in GaAs as seen by photoluminescence of high spectral and spatial resolution by Karaiskaj, D., Mascarenhas, A., Klem, J. F., Volz, K., Stolz, W., Adamcyk, M., Tiedje, T.

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Speckle with soft X-rays: A demonstration by Elsebitt, S., Karl, A., Scherer, R., Eberhardt, W., Adamcyk, M., Tiedje, T., Pistonesi, Carolina

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Coherent soft x-ray scattering from InP islands on a semiconductor substrate by Adamcyk, M., Nicoll, C., Pinnington, T., Tiedje, T., Eisebitt, S., Karl, A., Scherer, R., Eberhardt, W.

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Reliability evaluation of 1.3 micron, oxide-apertured, InGaAsN VCSELs by Naone, R.L., Wasinger, N.M., Beltran, J.G., Chirovsky, L.M.F., Rossler, J.M., Adamcyk, M., Van Hove, J.M., Kisker, D.W.

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