Search Results - Ahlport, B. T.

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  1. 1
    Easy Prediction of Degradation in Transistor Current Gain over Large Ranges of Operating Current

    Easy Prediction of Degradation in Transistor Current Gain over Large Ranges of Operating Current by Ahlport, B. T., Anderson, S. L.

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  2. 2
    C-MOS/SOS LSI input/Output protection networks

    C-MOS/SOS LSI input/Output protection networks by Ahlport, B.T., Cricchi, J.R., Barth, D.A.

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  3. 3
    Hardened MNOS/SOS Electrically Reprogrammable Nonvolatile Memory

    Hardened MNOS/SOS Electrically Reprogrammable Nonvolatile Memory by Cricchi, J. R., Fitzpatrick, M. D., Blaha, F. C., Ahlport, B. T.

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  4. 4
    Transient Radiation Screening of Silicon Devices Using Backside Laser Irradiation

    Transient Radiation Screening of Silicon Devices Using Backside Laser Irradiation by King, E. E., Ahlport, B., Tettemer, G., Mulker, K., Linderman, P.

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  5. 5
    Use of a Pinch Resistor for Neutron Hardness Assurance Screening of Bipolar Integrated Circuits

    Use of a Pinch Resistor for Neutron Hardness Assurance Screening of Bipolar Integrated Circuits by Ahlport, B., King, E. E., Russo, J., Long, D. M.

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  6. 6
    Radiation Hardened CMNOS/SOS Mask Programmable Rom and General Processor Unit

    Radiation Hardened CMNOS/SOS Mask Programmable Rom and General Processor Unit by Cricchi, J. R., Barth, D. A., Oehler, H. G., Lyman, R. C., Shipley, J. M., Ahlport, B.

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