Electron Energy-Loss Spectroscopy Method for Thin-Film Thickness Calculations with a Low Incident Energy Electron Beam by Jaber, Ahmad M. D. (Assa’d), Alsoud, Ammar, Al-Bashaish, Saleh R., Al Dmour, Hmoud, Mousa, Marwan S., Trčka, Tomáš, Holcman, Vladimír, Sobola, Dinara

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Structural and electrical characterization of cadmium phosphate glasses doped with different concentration of sodium chloride by Assayed, Ghada A I, Shaheen, Adel A, Alsoud, Ammar, Al-Bashaish, Saleh R, Mousa, Marwan S, Knápek, Alexandr, Sobola, Dinara

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Characterization of field emission from oxidized copper emitters by Abuamr, Adel M, Mousa, Marwan S, Al-Bashaish, Saleh R, Madanat, Mazen A, AlSoud, Ammar, Jaber, Ahmad M D (Assa’d), AlQaisi, Ali F, Al-Anber, Mohammed A, Barzinjy, Azeez A, Arrasheed, Enas A, Sobola, Dinara

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Electrical Characterization of Epoxy Nanocomposite under High DC Voltage by Alsoud, Ammar, Daradkeh, Samer I, Al-Bashaish, Saleh R, Shaheen, Adel A, Jaber, Ahmad M D Assa'd, Abuamr, Adel M, Mousa, Marwan S, Holcman, Vladimír

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Effect of traps and conductive pathways on electron emission from copper broad-area composite emitters by Alsoud, Ammar, Mousa, Marwan S, Al-Bashaish, Saleh R, Maghrabi, Mufeed, Al-Jbarart, Aseel A, Ronoh, Kipkurui, Sedlařík, Marek, Jaber, Ahmad M D (Assa’d), Abuamr, Adel M, Telfah, Ahmad, Trrad, Issam, Sedlak, Petr, Knápek, Alexandr, Sobola, Dinara

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