Search Results - Al-Mahasneh, A.A.

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    Spectroscopic ellipsometry of single and multilayer amorphous germanium/aluminum thin film systems

    Spectroscopic ellipsometry of single and multilayer amorphous germanium/aluminum thin film systems by Al-Mahasneh, A.A., Al Attar, H.A., Shahin, I.S.

    Published in Optics communications
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