Imaging Extended Defects in Low Z materials using Electron Channelling Contrast Imaging – New Approaches and Challenges by Naresh-Kumar, G., Alasamari, A., Hourahine, Ben, Trager-Cowan, C.

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Structural and luminescence imaging and characterisation of semiconductors in the scanning electron microscope by Trager-Cowan, C, Alasmari, A, Avis, W, Bruckbauer, J, Edwards, P R, Ferenczi, G, Hourahine, B, Kotzai, A, Kraeusel, S, Kusch, G, Martin, R W, McDermott, R, Naresh-Kumar, G, Nouf-Allehiani, M, Pascal, E, Thomson, D, Vespucci, S, Smith, M D, Parbrook, P J, Enslin, J, Mehnke, F, Kuhn, C, Wernicke, T, Kneissl, M, Hagedorn, S, Knauer, A, Walde, S, Weyers, M, Coulon, P-M, Shields, P A, Bai, J, Gong, Y, Jiu, L, Zhang, Y, Smith, R M, Wang, T, Winkelmann, A

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