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    Characterization of X-ray radiation damage in Si/SiO2 structures using second-harmonic generation

    Characterization of X-ray radiation damage in Si/SiO2 structures using second-harmonic generation by Marka, Z, Singh, S.K, Wang, W, Lee, S.C, Kavich, J, Glebov, B, Rashkeev, S.N, Karmarkar, A.P, Albridge, R.C, Pantelides, S.T, Schrimpf, R.D, Fleetwood, D.M, Tolk, N.H

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    Characterization of X-ray radiation damage in Si/SiO/sub 2/ structures using second-harmonic generation

    Characterization of X-ray radiation damage in Si/SiO/sub 2/ structures using second-harmonic generation by Marka, Z., Singh, S.K., Wang, W., Lee, S.C., Kavich, J., Glebov, B., Rashkeev, S.N., Karmarkar, A.P., Albridge, R.C., Pantelides, S.T., Schrimpf, R.D., Fleetwood, D.M., Tolk, N.H.

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