Search Results - Almerico, J. P.

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  1. 1
    Profile and Etch Characterization of High Wafer Temperature Etched Y1/Pt Stacks

    Profile and Etch Characterization of High Wafer Temperature Etched Y1/Pt Stacks by MARKS, S., ALMERICO, J. P.

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  2. 2
    The Profile and Device Characterization of High Wafer Temperature Etched Ir/PZT/Ir Stacks

    The Profile and Device Characterization of High Wafer Temperature Etched Ir/PZT/Ir Stacks by Marks, S., Almerico, J. P., Gay, M. K., Celii, F. G.

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  3. 3
    Contamination issues in plasma etching of non-volatile materials: managing by-product deposition

    Contamination issues in plasma etching of non-volatile materials: managing by-product deposition by Olson, K.A., Jerde, L., Almerico, J.P.

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  4. 4
    Feasibility analysis for dry plasma scribe lane etch for die separation in compound semiconductors

    Feasibility analysis for dry plasma scribe lane etch for die separation in compound semiconductors by Almerico, J.P., Werbaneth, P.F., Cho, Y.K.

    Published in III-Vs review
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  5. 5
    Pt/PZT/Pt and Pt/barrier stack etches for MEMS devices in a dual frequency high density plasma reactor

    Pt/PZT/Pt and Pt/barrier stack etches for MEMS devices in a dual frequency high density plasma reactor by Werbaneth, P., Almerico, J., Jerde, L., Marks, S., Wachtmann, B.

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