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Optical parameters of Ge15Sb5Se80 and Ge15Sb5Te80 from ellipsometric measurements
by
Abdel-Wahab, F.
,
Ashraf, I.M.
,
Alomairy, S.E.
Published in
Physica. B, Condensed matter
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Spectroscopic ellipsometry characterization of Ge30-xSbx Se70 films using combinations of multiple dispersion functions
by
Abdel-Wahab, F.
,
Badawi, A.
,
Alatibi, M.S.
,
Alomairy, S.E.
,
Ali karar, N.N.
,
Ashraf, I.M.
,
Ahmed, E.M.
Published in
Optik (Stuttgart)
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Physica B: Condensed Matter
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Physica. B, Condensed Matter
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