A (Dis-)information Theory of Revealed and Unrevealed Preferences: Emerging Deception and Skepticism via Theory of Mind by Alon, Nitay, Schulz, Lion, Rosenschein, Jeffrey S., Dayan, Peter

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(Mal)adaptive Mentalizing in the Cognitive Hierarchy, and Its Link to Paranoia by Alon, Nitay, Schulz, Lion, Bell, Vaughan, Moutoussis, Michael, Dayan, Peter, Barnby, Joseph M

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Mind Your Theory: Theory of Mind Goes Deeper Than Reasoning by Wagner, Eitan, Nitay Alon, Barnby, Joseph M, Abend, Omri

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Emergent Dominance Hierarchies in Reinforcement Learning Agents by Rachum, Ram, Nakar, Yonatan, Tomlinson, Bill, Nitay Alon, Mirsky, Reuth

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Detecting and Deterring Manipulation in a Cognitive Hierarchy by Nitay Alon, Schulz, Lion, Barnby, Joseph M, Rosenschein, Jeffrey S, Dayan, Peter

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Recurrent De Novo Dominant Mutations in SLC25A4 Cause Severe Early-Onset Mitochondrial Disease and Loss of Mitochondrial DNA Copy Number by Thompson, Kyle, Majd, Homa, Dallabona, Cristina, Reinson, Karit, King, Martin S., Alston, Charlotte L., He, Langping, Lodi, Tiziana, Jones, Simon A., Fattal-Valevski, Aviva, Fraenkel, Nitay D., Saada, Ann, Haham, Alon, Isohanni, Pirjo, Vara, Roshni, Barbosa, Inês A., Simpson, Michael A., Deshpande, Charu, Puusepp, Sanna, Bonnen, Penelope E., Rodenburg, Richard J., Suomalainen, Anu, Õunap, Katrin, Elpeleg, Orly, Ferrero, Ileana, McFarland, Robert, Kunji, Edmund R.S., Taylor, Robert W.

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Recurrent De Novo Dominant Mutations in SLC25A4 Cause Severe Early-Onset Mitochondrial Disease and Loss of Mitochondrial DNA Copy Number by Thompson, Kyle, Majd, Homa, Dallabona, Cristina, Reinson, Karit, King, Martin S., Alston, Charlotte L., He, Langping, Lodi, Tiziana, Jones, Simon A., Fattal-Valevski, Aviva, Fraenkel, Nitay D., Saada, Ann, Haham, Alon, Isohanni, Pirjo, Vara, Roshni, Barbosa, Inês A., Simpson, Michael A., Deshpande, Charu, Puusepp, Sanna, Bonnen, Penelope E., Rodenburg, Richard J., Suomalainen, Anu, Õunap, Katrin, Elpeleg, Orly, Ferrero, Ileana, McFarland, Robert, Kunji, Edmund R.S., Taylor, Robert W.

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Reliability qualification of semiconductor devices based on physics-of-failure and risk and opportunity assessment by Gerling, W. H., Preussger, A., Wulfert, F. W.

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The efficacy of a test and ESS program by Katz, Asaf, Argov, Nitay, Shapira, Alon, Gershman, Israel, Refaeli, Nir

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