Search Results - Alreja, Vijay

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    X-ray Backscatter Security Inspection with Enhanced Depth of Effective Detection and Material Discrimination

    X-ray Backscatter Security Inspection with Enhanced Depth of Effective Detection and Material Discrimination by Arodzero, Anatoli, Alreja, Vijay, Boucher, Salime, Burstein, Paul, Kulinich, Petr, Lanza, Richard C., Palermo, Vincent, Tran, Minh

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    Conference Proceeding
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