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Observations of Cluster Ions Originating from Non-Traditional Atom Probe Materials
by
Prosa, TJ
,
Alvis, RA
,
Kelly, TF
Published in
Microscopy and microanalysis
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Identification and Analysis of Fluorine Clustering in Boron Implants
by
Reinhard, DA
,
Lawrence, D
,
Alvis, RA
,
Ronsheim, P
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Microscopy and microanalysis
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Towards Quantitative Analysis of Nitrogen in Microelectronics Applications for Atom Probe Tomography
by
Ulfig, RM
,
Prosa, TJ
,
Reinhard, DA
,
Oltman, E
,
Alvis, RA
Published in
Microscopy and microanalysis
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Microscopy And Microanalysis
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Atom-Probe Analysis Of Non-Traditional Materials
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Boron
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Oxford Journals Online
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Cambridge University Press
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