Search Results - Amorim, Valéria S.O.

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    Thickness determination of multiphase layer via combined Rietveld and Grazing Incidence X-ray diffraction approach

    Thickness determination of multiphase layer via combined Rietveld and Grazing Incidence X-ray diffraction approach by Amorim, Valéria S.O., Calligaris, Guilherme A., Cardoso, Lisandro P., Paesano, Andrea, Valença, Gustavo P.

    Published in Thin solid films
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