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A new approach to the design, fabrication, and testing of chalcogenide-based multi-state phase-change nonvolatile memory
by
Ande, H.K.
,
Busa, P.
,
Balasubramanian, M.
,
Campbell, K.A.
,
Baker, R.J.
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Memory Reliability
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Nonvolatile Memory
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Pcm Test Chip
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Phase Change Materials
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Phase Change Memory
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