Search Results - Andricciola, P.

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  1. 1
    The Temperature Dependence of Mismatch in Deep-Submicrometer Bulk MOSFETs

    The Temperature Dependence of Mismatch in Deep-Submicrometer Bulk MOSFETs by Andricciola, P., Tuinhout, H.P.

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  2. 2
    Impact of Hot Carriers on nMOSFET Variability in 45- and 65-nm CMOS Technologies

    Impact of Hot Carriers on nMOSFET Variability in 45- and 65-nm CMOS Technologies by Magnone, P., Crupi, F., Wils, N., Jain, R., Tuinhout, H., Andricciola, P., Giusi, G., Fiegna, C.

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  3. 3
    Microsecond pulsed DC matching measurements on MOSFETs in strong and weak inversion

    Microsecond pulsed DC matching measurements on MOSFETs in strong and weak inversion by Andricciola, P., Tuinhout, H., Wils, N., Schmitz, J.

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  4. 4
    Impact of interface states on MOS transistor mismatch

    Impact of interface states on MOS transistor mismatch by Andricciola, P., Tuinhout, H.P., De Vries, B., Wils, N.A.H., Scholten, A.J., Klaassen, D.B.M.

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  5. 5
    FinFET Mismatch in Subthreshold Region: Theory and Experiments

    FinFET Mismatch in Subthreshold Region: Theory and Experiments by Magnone, Paolo, Crupi, Felice, Mercha, Abdelkarim, Andricciola, Pietro, Tuinhout, Hans, Lander, Robert J P

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