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Dynamics of Threshold Voltage Instability in IGZO TFTs: Impact of High Pressurized Oxygen Treatment on the Activation Energy Barrier
by
Song, Ji Hun
,
Oh, Nuri
,
Anh, Byung Du
,
Kim, Hye Dong
,
Jeong, Jae Kyeong
Published in
IEEE transactions on electron devices
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Ieee Transactions On Electron Devices
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Amorphous Indium-Gallium-Zinc-Oxide
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Annealing
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Interstitial Oxygen
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