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Search Results - Arkalgud, Sitaram R
Search Results - Arkalgud, Sitaram R
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300-mm Production-Worthy Magnetically Enhanced Non-Bosch Through-Si-Via Etch for 3-D Logic Integration
by
Teh, W H
,
Caramto, R
,
Chidambaram, Thenappan
,
Wei Wang
,
Arkalgud, Sitaram R
,
Saito, T
,
Maruyama, K
,
Maekawa, Kaoru
Published in
IEEE transactions on semiconductor manufacturing
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Leading edge 3D technology for high volume manufacturing
by
Arkalgud, S.R.
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A 16-Mb MRAM featuring bootstrapped write drivers
by
Gogl, D.
,
Arndt, C.
,
Barwin, J.C.
,
Bette, A.
,
DeBrosse, J.
,
Gow, E.
,
Hoenigschmid, H.
,
Lammers, S.
,
Lamorey, M.
,
Yu Lu
,
Maffitt, T.
,
Maloney, K.
,
Obermaier, W.
,
Sturm, A.
,
Viehmann, H.
,
Willmott, D.
,
Wood, M.
,
Gallagher, W.J.
,
Mueller, G.
,
Sitaram, A.R.
Published in
IEEE journal of solid-state circuits
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On the technology and ecosystem of 3D / TSV manufacturing
by
Hummler, K.
,
Smith, L.
,
Caramto, R.
,
Edgeworth, R.
,
Olson, S.
,
Pascual, D.
,
Qureshi, J.
,
Rudack, A.
,
Quon, R.
,
Arkalgud, S.
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Ieee Journal Of Solid-State Circuits
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Ieee Transactions On Semiconductor Manufacturing
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Subjects
Engineering
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3
Engineering, Electrical & Electronic
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3
Science & Technology
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Technology
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3
Through-Silicon Vias
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Applied Sciences
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Cmos Process
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Cmos Technology
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Design. Technologies. Operation Analysis. Testing
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Electronics
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Etching
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Exact Sciences And Technology
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Integrated Circuits
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Semiconductor Electronics. Microelectronics. Optoelectronics. Solid State Devices
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Silicon
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Tsv
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16 Mb
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1T1Mtj
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3D Interconnects
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3D Metrology
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Ieee Electronic Library (Iel) Conference Proceedings
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Ieee Xplore All Conference Series
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Ieee Electronic Library (Iel) Journals
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Ieee Xplore All Journals
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