Search Results - Attota, Ravi Kiran

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  1. 1
    Fidelity test for through-focus or volumetric type of optical imaging methods

    Fidelity test for through-focus or volumetric type of optical imaging methods by Attota, Ravi Kiran

    Published in Optics express
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  2. 2
    Through-focus or volumetric type of optical imaging methods: a review

    Through-focus or volumetric type of optical imaging methods: a review by Attota, Ravi Kiran

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  3. 3
    Step beyond Kohler illumination analysis for far-field quantitative imaging: angular illumination asymmetry (ANILAS) maps

    Step beyond Kohler illumination analysis for far-field quantitative imaging: angular illumination asymmetry (ANILAS) maps by Attota, Ravi Kiran

    Published in Optics express
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  4. 4
    Parameter optimization for through-focus scanning optical microscopy

    Parameter optimization for through-focus scanning optical microscopy by Attota, Ravi Kiran, Kang, Hyeonggon

    Published in Optics express
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  5. 5
    Optical microscope illumination analysis using through-focus scanning optical microscopy

    Optical microscope illumination analysis using through-focus scanning optical microscopy by Attota, Ravi Kiran, Park, Haesung

    Published in Optics letters
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  6. 6
    Enhancing optical microscopy illumination to enable quantitative imaging

    Enhancing optical microscopy illumination to enable quantitative imaging by Agocs, Emil, Attota, Ravi Kiran

    Published in Scientific reports
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  7. 7
    Computational Process Control Compatible Dimensional Metrology Tool: Through-focus Scanning Optical Microscopy

    Computational Process Control Compatible Dimensional Metrology Tool: Through-focus Scanning Optical Microscopy by Attota, Ravi Kiran

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  8. 8
    Volume determination of irregularly-shaped quasi-spherical nanoparticles

    Volume determination of irregularly-shaped quasi-spherical nanoparticles by Attota, Ravi Kiran, Liu, Eileen Cherry

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  9. 9
    Feasibility study on 3-D shape analysis of high-aspect-ratio features using through-focus scanning optical microscopy

    Feasibility study on 3-D shape analysis of high-aspect-ratio features using through-focus scanning optical microscopy by Attota, Ravi Kiran, Weck, Peter, Kramar, John A, Bunday, Benjamin, Vartanian, Victor

    Published in Optics express
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  10. 10
    Nondestructive shape process monitoring of three-dimensional, high-aspect-ratio targets using through-focus scanning optical microscopy

    Nondestructive shape process monitoring of three-dimensional, high-aspect-ratio targets using through-focus scanning optical microscopy by Attota, Ravi Kiran, Kang, Hyeonggon, Scott, Keana, Allen, Richard, Vladar, Andras E, Bunday, Benjamin

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  11. 11
    Detecting nanoscale contamination in semiconductor fabrication using through-focus scanning optical microscopy

    Detecting nanoscale contamination in semiconductor fabrication using through-focus scanning optical microscopy by Rim, Min-Ho, Agocs, Emil, Dixson, Ronald, Kavuri, Prem, Vladár, András E., Attota, Ravi Kiran

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  12. 12
    A Better Method for Volume Determination of Regularly and Irregularly Shaped Nanoparticles with Enhanced Accuracy

    A Better Method for Volume Determination of Regularly and Irregularly Shaped Nanoparticles with Enhanced Accuracy by Attota, Ravi Kiran

    Published in arXiv.org
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