Search Results - Aur, S.-W.

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  1. 1
    Failure in CMOS circuits induced by hot carriers in multi-gate transistors

    Failure in CMOS circuits induced by hot carriers in multi-gate transistors by Chatterjee, A., Aur, S.-W., Niuya, T., Yang, P., Seitchik, J.A.

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  2. 2
    CMOS metal replacement gate transistors using tantalum pentoxide gate insulator

    CMOS metal replacement gate transistors using tantalum pentoxide gate insulator by Chatterjee, A., Chapman, R.A., Joyner, K., Otobe, M., Hattangady, S., Bevan, M., Brown, G.A., Yang, H., He, Q., Rogers, D., Fang, S.J., Kraft, R., Rotondaro, A.L.P., Terry, M., Brennan, K., Aur, S.-W., Hu, J.C., Tsai, H.-L., Jones, P., Wilk, G., Aoki, M., Rodder, M., Chen, I.-C.

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  3. 3
    Analog integration in a 0.35 /spl mu/m Cu metal pitch, 0.1 /spl mu/m gate length, low-power digital CMOS technology

    Analog integration in a 0.35 /spl mu/m Cu metal pitch, 0.1 /spl mu/m gate length, low-power digital CMOS technology by Chatterjee, A., Mosher, D., Sridhar, S., Kim, Y., Nandakumar, M., Aur, S.-W., Chen, Z., Madhani, P., Tang, S., Aggarwal, R., Ashburn, S., Shichijo, H.

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