Search Results - Avanci, L.H

  • Showing 1 - 6 results of 6
Refine Results
  1. 1
    DSC studies on crystallization mechanisms of tellurite glasses

    DSC studies on crystallization mechanisms of tellurite glasses by Yukimitu, K., Oliveira, R.C., Araújo, E.B., Moraes, J.C.S., Avanci, L.H.

    Published in Thermochimica acta
    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  2. 2
    Synchrotron radiation X-ray multiple diffraction in the study of KDP phase transition induced by electric field

    Synchrotron radiation X-ray multiple diffraction in the study of KDP phase transition induced by electric field by Santos, A.O. dos, Gelamo, R.V., Li, B.B., Cardoso, L.P., Miranda, M.A.R., Nogueira, M.A.M., Remédios, C.M.R., Melo, F.E.A., Sasaki, J.M., Avanci, L.H., Morelhão, S.L.

    Get full text
    Items that this one cites
    Article
    Save to List
    Saved in:
  3. 3
    Study of crystalline structures via physical determination of triplet phase invariants

    Study of crystalline structures via physical determination of triplet phase invariants by Morelhão, S.L., Avanci, L.H., Kycia, S.

    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  4. 4
    Automatic X-ray crystallographic phasing at LNLS

    Automatic X-ray crystallographic phasing at LNLS by Morelhão, S.L., Avanci, L.H., Kycia, S.

    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  5. 5
    Mapping of Bragg-surface diffraction of InP/GaAs(1 0 0) structure

    Mapping of Bragg-surface diffraction of InP/GaAs(1 0 0) structure by Avanci, L.H, Hayashi, M.A, Cardoso, L.P, Morelhão, S.L, Riesz, F, Rakennus, K, Hakkarainen, T

    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  6. 6
    Strain field of InAs QDs on GaAs (001) substrate surface: characterization by synchrotron X-ray Renninger scanning

    Strain field of InAs QDs on GaAs (001) substrate surface: characterization by synchrotron X-ray Renninger scanning by Morelhão, S.L., Avanci, L.H., Freitas, R., Quivy, A.A.

    Published in Microelectronics
    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:

Search Tools: