Annealing of defects in irradiated silicon detector materials with high oxygen content by Mikelsen, M, Monakhov, E V, Alfieri, G, Avset, B S, Härkönen, J, Svensson, B G

Get full text

Formation of a double acceptor center during divacancy annealing in low-doped high-purity oxygenated Si by Monakhov, E. V., Avset, B. S., Hallén, Anders, Svensson, B. G.

Get full text

Laplace transform transient spectroscopy study of a divacancy-related double acceptor centre in Si by Monakhov, E V, Alfieri, G, Avset, B S, Hallén, A, Svensson, B G

Get full text

Kinetics of divacancy annealing and divacancy-oxygen formation in oxygen-enriched high-purity silicon by MIKELSEN, M, MONAKHOV, E. V, ALFIERI, G, AVSET, B. S, SVENSSON, B. G

Get full text

On the formation of the L-centre in silicon during heat treatment in the temperature range 205–285°C by Mikelsen, M, Monakhov, E V, Avset, B S, Svensson, B G

Get full text

End-user survey for digital sensor characteristics: a pilot questionnaire study by Li, G, van der Stelt, P F, Verheij, J G C, Speller, R, Galbiati, A, Psomadellis, F, Turchetta, R, Theodoridis, S, Hall, G, Avset, B S, Triantis, F A, Longo, R

Get full text

Annealing dynamics of irradiation-induced defects in high-purity silicon in the presence of hydrogen by Bleka, J. H., Malmbekk, H., Monakhov, E. V., Svensson, B. G., Avset, B. S.

Get full text

On the identity of a crucial defect contributing to leakage current in silicon particle detectors by Bleka, J. H., Murin, L., Monakhov, E. V., Avset, B. S., Svensson, B. G.

Get full text

Radiation hard silicon detectors—developments by the RD48 (ROSE) collaboration by Lindström, G, Ahmed, M, Albergo, S, Anderson, D, Augelli, V, Bacchetta, N, Bartalini, P, Bates, R, Biggeri, U, Bisello, D, Boemi, D, Borchi, E, Burger, P, Campabadal, F, Chilingarov, A, Ciampolini, P, Cindro, V, Creanza, D, Da Via, C, Davies, G, De Boer, W, Dell’Orso, R, Dezillie, B, Eremin, V, Evrard, O, Fanourakis, G, Feick, H, Focardi, E, Fonseca, L, Fretwurst, E, Fuster, J, Gabathuler, K, Glaser, M, Hall, G, Heising, S, Holmes-Siedle, A, Hughes, G, Jones, B.K, Jungermann, L, Kohout, Z, Kramberger, G, Kuhnke, M, Kwan, S, Lemeilleur, F, Leroy, C, Li, Z, Ligonzo, T, Linhart, V, Litovchenko, P, Loukas, D, Lozano, M, Luczynski, Z, Lutz, G, MacEvoy, B, Manolopoulos, S, Markou, A, Martinez, C, Messineo, A, Moll, M, Oshea, V, Parrini, G, Passeri, D, Petre, D, Pickford, A, Pintilie, I, Pospisil, S, Raine, C, Ratoff, P.N, Richter, R.H, Roy, P, Ruzin, A, Ryazanov, A.I, Santocchia, A, Schiavulli, L, Sicho, P, Slysz, W, Smith, K, Stolze, K, Sundby Avset, B, Svensson, B, Tivarus, C, Tricomi, A, Tzamarias, S, Valvo, G, Vasilescu, A, Vayaki, A, Verbitskaya, E, Verdini, P, Vrba, V, Watts, S, Weber, E.R, Wegrzecki, M, Wegrzecka, I, Wheadon, R, Wilhelm, I, Wunstorf, R, Wüstenfeld, J, Wyss, J, Zankel, K, Žontar, D

Get full text

HERA-B detectors with p-spray isolation on the n-side; unirradiated results by Schjolberg-Henriksen, K., Westgaard, T., Sundby Avset, B.

Get full text

Rapid annealing of the vacancy-oxygen center and the divacancy center by diffusing hydrogen in silicon by Bleka, J. H., Pintilie, I., Monakhov, E. V., Avset, B. S., Svensson, B. G.

Get full text

Room-temperature annealing of vacancy-type defect in high-purity n -type Si by Bleka, J. H., Monakhov, E. V., Svensson, B. G., Avset, B. S.

Get full text

On the identity of a crucial defect contributing to leakage currentin silicon particle detectors by Bleka, J. H., Murin, L., Monakhov, E. V., Avset, B. S., Svensson, B. G.

Get full text

Radiation damage studies of field plate and p-stop n-side silicon microstrip detectors by Matheson, J, Moser, H.-G, Roe, S, Weilhammer, P, Moszczynski, S, Dabrowski, W, Grybos, P, Idzik, M, Skoczen, A, Gill, K, Hall, G, MacEvoy, B, Vitè, D, Wheadon, R, Allport, P, Green, C, Richardson, J, Apsimon, R, Evensen, L, Avset, B, Giubellino, P, Ramello, L

Get full text

Annealing of the divacancy-oxygen and vacancy-oxygen complexes in silicon by Mikelsen, M., Bleka, J. H., Christensen, J. S., Monakhov, E. V., Svensson, B. G., Härkönen, J., Avset, B. S.

Get full text

Silicon wafer oxygenation from SiO2 layers for radiation hard detectors by Fonseca, L., Lozano, M., Campabadal, F., Martı́nez, C., Ullán, M., Avset, B.S., Ruzin, A., Lemeilleur, F., Nossarzewska-Orlowska, E.

Get full text

Radiation-hard semiconductor detectors for SuperLHC by Bruzzi, M., Alfieri, G., Assouak, S., Avset, B.S., Baranova, E., Basile, A., Bisello, D., Bolla, G., Bosisio, L., V. Bowcock, T.J., Brukhanov, A., Buda, M., Buhmann, P., Campabadal, F., Campbell, D., Cavallini, A., Chren, D., Cindro, V., Collins, P., Coutinho, J., Cunningham, W., Dalla Betta, G.-F., Davies, G., Dawson, I., Dervan, P., Ferbel, T., Fizzotti, F., Fleta, C., Franchenko, S., Garcia, C., Garcia-Navarro, J.E., Glaser, M., González Sevilla, S., Grigoriev, E., Grillo, A., Groza, A., Haddad, L., Hauler, F., Horazdovsky, T., Horisberger, R., Hruban, A., Joram, C., Kalinina, E., Kaminski, P., Karpenko, A., Kazlauskiene, V., Klaiber-Lodewigs, J., Kodys, P., Krasel, O., Kuznetsov, A., Lastovetsky, V., Leroy, C., Lindstrom, L., Litovchenko, A., Litvinov, V., Lo Giudice, A., Luczynski, Z., Mainwood, A., Makarenko, L.F., Marunko, S., Mathieson, K., Menichelli, D., Miglio, S., Monakhov, E., Nava, F., Oshea, V., Parkes, C., Pein, U., Petasecca, M., Piatkowski, B., Pinho, N., Popa, A.I., Pucker, G., Rafí, J.M., Rohe, T., Ronchin, S., Rott, C., Roy, A., Ruzin, A., Ryazanov, A., Sadrozinski, H.F.W., Sakalauskas, S., Sciortino, S., Seiden, A., Sellin, P., Shipsey, I., Son, S., Strupinski, W., Surma, B., Svensson, B.G., Uebersee, H., Uher, J., Vaitkus, J.V., Vrba, V., Wilhelm, I., Worm, S., Wunstorf, R., Zaluzhny, A., Zen, M., Zorzi, N.

Get full text

Punch-through currents and floating strip potentials in silicon detectors by Ellison, J., Hall, G., Roe, S., Wheadon, R., Avset, B.S., Evensen, L.

Get full text

Development of radiation tolerant semiconductor detectors for the Super-LHC by Moll, M., Adey, J., Artuso, M., Assouak, S., Biagi, S.F., Bilei, G.M., Bisello, D., Bortoletto, D., Boscardin, M., Bosisio, L., Broz, J., Candelori, A., Casse, G., Chilingarov, A., Cindro, V., Collins, P., Cunningham, W., Dawson, I., De Palma, M., Dittongo, S., Dolezal, Z., Dolgolenko, A., Fall, C., Fleta, C., Forton, E., Gaubas, E., Gill, K.A., Giolo, K., González Sevilla, S., Gorelov, I., Goss, J., Gouldwell Bates, A., Grégoire, G., Grigoriev, E., Grillo, A.A., Hönniger, F., Horisberger, R., Houdayer, A., Hourahine, B., Hughes, G., Irmscher, K., Ivanov, A., Joram, C., Kaminski, P., Kazukauskas, V., Khivrich, V., Khomenkov, V., Kierstead, J., Kodys, P., Korjenevski, S., Kozlowski, R., Kozodaev, M., Kuznetsov, A., Lassila-Perini, K., Lazanu, S., Litovchenko, P., Luczynski, Z., Mandić, I., Manfredotti, C., Menichelli, D., Metcalfe, J., Miglio, S., Mikuž, M., Nossarzewska-Orlowska, E., Passeri, D., Perera, L., Piemonte, C., Pignatel, G.U., Pinho, N., Pintilie, L., Polivtsev, L., Popa, A., Popule, J., Pozza, A., Rafí, J.M., Ronchin, S., Rott, C., Ruzin, A., Sciortino, S., Scorzoni, A., Seidel, S., Seiden, A., Sicho, P., Sloan, T., Sopko, V., Stahl, J., Stolze, D., Storasta, J., Surma, B., Suvorov, A., Tipton, P., Tsvetkov, A., Tuuva, T., Uebersee, H., Ullán, M., Velthuis, J., Vrba, V., Zabierowski, P., Zavrtanik, M., Zorzi, N.

Get full text

A new microstrip detector with double-sided readout by Avset, B.S., Evensen, L., Chabaud, V., Dijkstra, H., Horisberger, R., Hubbeling, L., Maehlum, G., Peisert, A., Roditi, I., Weilhammer, P., Czermak, A., Jalocha, P., Turala, M., Bambade, P., Dulinski, W., Turchetta, R., Schaeffer, M., Battaglia, M., Hietanen, I., Tuuva, T.

Get full text