Search Results - Bähler, Th

  • Showing 1 - 3 results of 3
Refine Results
  1. 1
    Thirty per cent contrast in secondary-electron imaging by scanning field-emission microscopy

    Thirty per cent contrast in secondary-electron imaging by scanning field-emission microscopy by Zanin, D. A., De Pietro, L. G., Peter, Q., Kostanyan, A., Cabrera, H., Vindigni, A., Bähler, Th, Pescia, D., Ramsperger, U.

    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  2. 2
    Scanning Field Emission Microscopy with Polarization Analysis (SFEMPA)

    Scanning Field Emission Microscopy with Polarization Analysis (SFEMPA) by Bertolini, G., De Pietro, L., Bähler, Th, Cabrera, H., Gürlü, O., Pescia, D., Ramsperger, U.

    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  3. 3
    Thirty per cent contrast in secondary-electron imaging by scanning field-emission microscopy

    Thirty per cent contrast in secondary-electron imaging by scanning field-emission microscopy by Zanin, D. A., De Pietro, L. G., Peter, Q., Kostanyan, A., Cabrera, H., Vindigni, A., Bähler, Th, Pescia, D., Ramsperger, U.

    Get full text
    Article
    Save to List
    Saved in:

Search Tools: