Combined Bulk and Surface Radiation Damage Effects at Very High Fluences in Silicon Detectors: Measurements and TCAD Simulations by Moscatelli, F., Passeri, D., Morozzi, A., Mendicino, Roberto, Dalla Betta, G.-F, Bilei, G. M.

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Advances in the TCAD modelling of non-irradiated and irradiated Low-Gain Avalanche Diode sensors by Croci, T., Morozzi, A., Fondacci, A., Lanteri, L., Siviero, F., Sola, V., Ferrero, M., Menzio, L., Mulargia, R., Arcidiacono, R., Cartiglia, N., Bilei, G.M., Passeri, D., Moscatelli, F.

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Effects of Interface Donor Trap States on Isolation Properties of Detectors Operating at High-Luminosity LHC by Moscatelli, F., Passeri, D., Morozzi, A., Mattiazzo, S., Dalla Betta, G.-F, Dragicevic, M., Bilei, G. M.

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Characterization of irradiated p-type silicon detectors for TCAD surface radiation damage model validation by Morozzi, A., Moscatelli, F., Lombardi, G., Bilei, G.M., Hinger, V., Bergauer, T., Passeri, D.

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Surface damage characterization of FBK devices for High Luminosity LHC (HL-LHC) operations by Moscatelli, F., Passeri, D., Morozzi, A., Betta, G.-F. Dalla, Mattiazzo, S., Bomben, M., Bilei, G.M.

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A Pattern Recognition Mezzanine based on Associative Memory and FPGA technology for Level 1 Track Triggers for the HL-LHC upgrade by Magalotti, D., Alunni, L., Biesuz, N., Bilei, G.M., Citraro, S., Crescioli, F., Fanò, L., Fedi, G., Magazzù, G., Servoli, L., Storchi, L., Palla, F., Placidi, P., Rossi, E., Spiezia, A.

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Modeling of radiation damage effects in silicon detectors at high fluences HL-LHC with Sentaurus TCAD by Passeri, D., Moscatelli, F., Morozzi, A., Bilei, G.M.

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Physical modeling of silicon microstrip detectors: influence of the electrode geometry on critical electric fields by Passeri, D., Ciampolini, P., Scorzoni, A., Bilei, G.M.

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Advances on TCAD numerical modelling of radiation damage effects in silicon detectors for HL-LHC operations by Passeri, D., Morozzi, A., Moscatelli, F., Lombardi, G., Bilei, G.M.

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Measurements and simulations of surface radiation damage effects on IFX and HPK test structures by Moscatelli, F., Morozzi, A., Passeri, D., Mattiazzo, S., Dalla Betta, G.-F., Bergauer, T., Dragicevic, M., Hinger, V., Bilei, G.M.

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Design and simulation studies of the silicon sensors for CMS by Ciampolini, P, Passeri, D, Bilei, G.M, Placidi, P

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Test results and prospects for RD53A, a large scale 65 nm CMOS chip for pixel readout at the HL-LHC by Gaioni, Luigi

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Analysis of surface radiation damage effects at HL-LHC fluences: Comparison of different technology options by Moscatelli, F., Morozzi, A., Passeri, D., Mattiazzo, S., Betta, G.-F. Dalla, Bergauer, T., Dragicevic, M., Konig, A., Hinger, V., Bilei, G.M.

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A comprehensive analysis of low-resistivity silicon radiation detectors by Passeri, D., Bilei, G.M., Ciampolini, P.

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Analysis of the transient response of LED-illuminated diodes under heavy radiation damage by Passeri, D., Ciampolini, P., Bilei, G.M., Casse, G., Lemeilleur, F.

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RD53 pixel chips for the ATLAS and CMS Phase-2 upgrades at HL-LHC by Loddo, F., Andreazza, A., Arteche, F., Barbero, M.B., Barillon, P., Beccherle, R., Bjalas, W., Bonaldo, S., Bortoletto, D., Calderini, G., Caratelli, A., Christian, D.C., Christiansen, J., Conti, E., Crescioli, F., Daas, M., De Robertis, G., Demaria, N., Deptuch, G.C., Dieter, Y., Dimitrievska, A., Ding, L., Esposito, S., Exarchou, D., Fahim, F., Fioriti, A., Fougeron, D., Gaioni, L., Garcia-Sciveres, M., Gerardin, S., Gnani, D., Grippo, M., Gromov, V., Hamer, M., Havranek, M., Heim, T., Hemperek, T., Hinterkeuser, F., Hoff, J., Huiberts, S., Janssen, J., Jirsa, J., John, J.J., Kampkotter, J., Karagounis, M., Khwaira, Y., Kluit, R., Krieger, A., Krueger, H., Lalic, J., Lauritzen, M., Licciulli, F., Lipton, R., Liu, T., Lopez Morillo, E., Lounis, A., Luongo, F., Magazzu, G., Marcisovsky, M., Marconi, S., Marquez Lasso, F., Marzocca, C., Mattiazzo, S., Menouni, M., Minuti, M., Mironova, M., Miryala, S., Monteil, E., Moustakas, K., Muõz Chavero, F., Neue, G., Orfanelli, S., Paccagnella, A., Pacher, L., Palla, F., Palomo Pinto, F.R., Papadopoulou, A., Paterno, A., Petri, A., Placidi, P., Pradas, A., Prydderch, M.L., Pulli, A., Ratti, L., Re, V., Rehman, A., Rymaszewski, P., Solal, M.C., Standke, M., Stiller, A., Strebler, T., Stugu, B., Thomas, S., Traversi, G., Vogrig, D., Vogt, M., Wang, T., Yang, H., Zdenko, J., Zimmerman, T.

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Comprehensive modeling of bulk-damage effects in silicon radiation detectors by Passeri, D., Ciampolini, P., Bilei, G.M., Moscatelli, F.

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TCAD-based analysis of radiation-hardness in silicon detectors by Passeri, D., Baroncini, M., Ciampolini, P., Bilei, G.M., Santocchia, A., Checcucci, B., Fiandrini, E.

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The silicon sensors for the Compact Muon Solenoid tracker—design and qualification procedure by Agram, J.-L, Angarano, M.M, Assouak, S, Bergauer, T, Bilei, G.M, Borrello, L, Brianzi, M, Civinini, C, Dierlamm, A, Dinu, N, Demaria, N, Feld, L, Focardi, E, Fontaine, J.-C, Forton, E, Furgeri, A, Gregoire, Gh, Hartmann, F, Honma, A, Juillot, P, Kartashov, D, Krammer, M, Macchiolo, A, Mannelli, M, Messineo, A, Migliore, E, Militaru, O, Piasecki, C, Santinelli, R, Sentenac, D, Servoli, L, Starodumov, A, Tonelli, G, Wang, J

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A combined surface and bulk TCAD damage model for the analysis of radiation detectors operating at HL-LHC fluences by Morozzi, A., Passeri, D., Moscatelli, F., Betta, G.-F. Dalla, Bilei, G.M.

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