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Modeling and Analysis of Through-Silicon Via (TSV) Noise Coupling and Suppression Using a Guard Ring
by
Cho, Jonghyun
,
Song, Eakhwan
,
Yoon, Kihyun
,
Pak, Jun So
,
Kim, Joohee
,
Lee, Woojin
,
Song, Taigon
,
Kim, Kiyeong
,
Lee, Junho
,
Lee, Hyungdong
,
Park, Kunwoo
,
Yang, Seungtaek
,
Suh, Minsuk
,
Byun, Kwangyoo
,
Kim, Joungho
Published in
IEEE transactions on components, packaging, and manufacturing technology (2011)
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Modeling and Analysis of Through-Silicon Via (TSV) Noise Coupling and Suppression Using a Guard Ring : THROUGH SILICON VIAS
by
CHO, Jonghyun
,
SONG, Eakhwan
,
PARK, Kunwoo
,
YANG, Seungtaek
,
SUH, Minsuk
,
BYUN, Kwangyoo
,
KIM, Joungho
,
YOON, Kihyun
,
JUN SO PAK
,
KIM, Joohee
,
LEE, Woojin
,
SONG, Taigon
,
KIM, Kiyeong
,
LEE, Junho
,
LEE, Hyungdong
Published in
IEEE transactions on components, packaging, and manufacturing technology (2011)
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The effect of ultrasonic power on bonding pad and IMD layers in ultrasonic wire bonding
by
Insu Jeon
,
Qwanho Chung
,
Joonki Hong
,
Kwangyoo Byun
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Ieee Transactions On Components, Packaging, And Manufacturing Technology
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Ieee Transactions On Components, Packaging And Manufacturing Technology
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Engineering
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Engineering, Electrical & Electronic
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Materials Science
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Materials Science, Multidisciplinary
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Science & Technology
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Technology
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Applied Sciences
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Bonding
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Capacitive Sensors
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Couplings
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Design. Technologies. Operation Analysis. Testing
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Dielectrics
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Electronics
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Exact Sciences And Technology
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Finite Element Methods
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Guard Ring
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Integrated Circuit Modeling
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Integrated Circuits
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Intermetallic
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Ieee Electronic Library (Iel) Journals
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