Search Results - Babu, Sachidananda R.

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  1. 1
    A Spaceborne Demonstration of P-Band Signals-of-Opportunity (SoOp) Reflectometry

    A Spaceborne Demonstration of P-Band Signals-of-Opportunity (SoOp) Reflectometry by Garrison, James L., Nold, Benjamin, Masters, Dallas, Brown, Conor, Bridgeman, Jordan, Mansell, Justin, Vega, Manuel, Bindlish, Rajat, Piepmeier, J.R., Babu, Sachidananda R.

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  2. 2
    Proton Radiation Effects on HgCdTe Avalanche Photodiode Detectors

    Proton Radiation Effects on HgCdTe Avalanche Photodiode Detectors by Sun, Xiaoli, Abshire, James B., Lauenstein, Jean-Marie, Babu, Sachidananda R., Beck, Jeff D., Sullivan, William W., Hubbs, John E.

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  3. 3
    SNOOPI: Demonstrating Earth remote sensing using P-band signals of opportunity (SoOp) on a CubeSat

    SNOOPI: Demonstrating Earth remote sensing using P-band signals of opportunity (SoOp) on a CubeSat by Garrison, James L., Vega, Manuel A., Shah, Rashmi, Mansell, Justin R., Nold, Benjamin, Raymond, Juan, Banting, Roger, Bindlish, Rajat, Larsen, Kameron, Kim, Seho, Li, Weihang, Kurum, Mehmet, Piepmeier, Jeffrey, Khalifi, Hasnaa, Tanner, Forrest A., Horgan, Kevin, Kielbasa, Chase E., Babu, Sachidananda R.

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  4. 4
    Light-ion-bombarded p-type In0.53Ga0.47As

    Light-ion-bombarded p-type In0.53Ga0.47As by RAO, M. V, SACHIDANANDA BABU, R, DIETRICH, H. B, THOMPSON, P. E

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  5. 5
    Remote Sensing Using VNIR/SWIR Dispersive Imaging Spectrometers: Historical Development, Current State-of-the-Art, and Furture Trends

    Remote Sensing Using VNIR/SWIR Dispersive Imaging Spectrometers: Historical Development, Current State-of-the-Art, and Furture Trends by Lockwood, Ronald B., Chrisp, Michael P., Parameswaran, Lalitha, Thome, Kurtis J., Babu, Sachidananda R.

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  6. 6
    Annealing of Si damage caused by reactive ion etching in SF6 gas mixtures

    Annealing of Si damage caused by reactive ion etching in SF6 gas mixtures by PINTO, R, SACHIDANANDA BABU, R, BHATTACHARYA, P. K

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  7. 7
    Si-implantation into GaAs grown on Si

    Si-implantation into GaAs grown on Si by RAO, M. V, SACHIDANANDA BABU, R, BERRY, A. K

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  8. 8
    Annealing of Si damage caused by reactive ion etching in SF sub(6) gas mixtures

    Annealing of Si damage caused by reactive ion etching in SF sub(6) gas mixtures by Pinto, R, Sachidananda Babu, R, Bhattacharya, P K

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  9. 9
    Approaches to Reduced-Defect Active Regions for III-N Devices

    Approaches to Reduced-Defect Active Regions for III-N Devices by Eddy, Charles R., Mastro, Michael, Bassim, Nabil, Twigg, Mark, Henry, Richard, Holm, Ronald, Culbertson, James, Glembocki, Orest, Caldwell, Joshua D., Neudeck, Phillip, Trunek, Andrew, Powell, J. Anthony, Peckerar, Martin, Ngu, Yves, Yan, Feng, Babu, Sachidananda

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