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Automatic classification of C-SAM voids for root cause identification of bonding yield degradation
by
Baderot, Julien
,
Garrais, Solange
,
Martinez, Sergio
,
Foucher, Johann
,
Eto, Ryuji
,
Tanida, Kazumasa
,
Yasui, Takatoshi
,
Tanaka, Tomoya
Published in
IEEE transactions on semiconductor manufacturing
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Deep learning contour-based method for semi-automatic annotation of manufactured objects in electron microscopy images
by
Sanou, Isaac Wilfried
,
Baderot, Julien
,
Bricq, Stéphanie
,
Benezeth, Yannick
,
Marzani, Franck
,
Martinez, Sergio
,
Foucher, Johann
Published in
Journal of electronic imaging
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Tree of Shapes Cut for Material Segmentation Guided by a Design
by
Baderot, Julien
,
Desvignes, Michel
,
Condat, Laurent
,
Mura, Mauro Dalla
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Optimization of Complex Process, Based on Design Of Experiments, a Generic Methodology
by
Baderot, Julien
,
Cauchepin, Yann
,
Seiller, Alexandre
,
Fontanges, Richard
,
Martinez, Sergio
,
Foucher, Johann
,
Fuchs, Emmanuel
,
Daanoune, Mehdi
,
Grenier, Vincent
,
Barra, Vincent
,
Guillin, Arnaud
Published in
arXiv.org
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Ieee Transactions On Semiconductor Manufacturing
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