Search Results - Bae, Hui-Kyoung

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    Dependence of Analog and Digital Performances on Mechanical Film Stress of ILD Layers in Nanoscale CMOSFETs

    Dependence of Analog and Digital Performances on Mechanical Film Stress of ILD Layers in Nanoscale CMOSFETs by Ji, Hee-Hwan, Park, Sung-Hyung, Kim, Yong-Goo, Wang, Jin-Suk, Lee, Hi-Deok, Baek, Seong-Hak, Kim, Kyoung-Cheol, Song, Byeung-Soo, Bae, Hui-Kyoung, Lee, Heui-Seung, Kang, Young-Seok, Kim, Dae-Byung, Park, Jin-Won

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