Search Results - Bain, Micheal F.

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    Characterization of Rapid Melt Growth (RMG) Process for High Quality Thin Film Germanium on Insulator

    Characterization of Rapid Melt Growth (RMG) Process for High Quality Thin Film Germanium on Insulator by Zainal, Nurfarina, Mitchell, S.J.Neil, McNeill, David W., Bain, Micheal F., Armstrong, B.M., Baine, Paul T., Adley, David, Perova, Tatania S.

    Published in ECS transactions
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