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A Hybrid Technique based on ECC and Hardened Cells for Tolerating Random Multiple-Bit Upsets in SRAM arrays
by
Gil-Tomas, Daniel
,
Saiz-Adalid, Luis J.
,
Gracia-Moran, Joaquin
,
Baraza-Calvo, J. Carlos
,
Gil-Vicente, Pedro J.
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IEEE access
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Ultrafast Codes for Multiple Adjacent Error Correction and Double Error Detection
by
Saiz-Adalid, Luis-J.
,
Gracia-Moran, Joaquin
,
Gil-Tomas, Daniel
,
Baraza-Calvo, J.-Carlos
,
Gil-Vicente, Pedro-J.
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A Proposal of an ECC-based Adaptive Fault-Tolerant Mechanism for 16-bit data words
by
Gracia-Moran, Joaquin
,
Saiz-Adalid, Luis-J.
,
Baraza-Calvo, J.-Carlos
,
Gil-Tomas, Daniel
,
Gil-Vicente, Pedro-J.
Published in
Revista IEEE América Latina
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Injecting Intermittent Faults for the Dependability Assessment of a Fault-Tolerant Microcomputer System
by
Gil-Tomas, Daniel
,
Gracia-Moran, Joaquin
,
Baraza-Calvo, J.-Carlos
,
Saiz-Adalid, Luis-J
,
Gil-Vicente, Pedro-J
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IEEE transactions on reliability
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Reducing the Overhead of BCH Codes: New Double Error Correction Codes
by
Saiz-Adalid, Luis-J.
,
Gracia-Morán, Joaquín
,
Gil-Tomás, Daniel
,
Baraza-Calvo, J.-Carlos
,
Gil-Vicente, Pedro-J.
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Electronics (Basel)
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Proposal of an Adaptive Fault Tolerance Mechanism to Tolerate Intermittent Faults in RAM
by
Baraza-Calvo, J.-Carlos
,
Gracia-Morán, Joaquín
,
Saiz-Adalid, Luis-J.
,
Gil-Tomás, Daniel
,
Gil-Vicente, Pedro-J.
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Electronics (Basel)
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Studying the effects of intermittent faults on a microcontroller
by
Gil-Tomás, Daniel
,
Gracia-Morán, Joaquín
,
Baraza-Calvo, J.-Carlos
,
Saiz-Adalid, Luis-J.
,
Gil-Vicente, Pedro-J.
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Microelectronics and reliability
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Design, Implementation and Evaluation of a Low Redundant Error Correction Code
by
Gracia-Moran, Joaquin
,
Saiz Adalid, Luis J.
,
Baraza Calvo, Juan Carlos
,
Gil Tomas, Daniel
,
Gil Vicente, Pedro J.
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Revista IEEE América Latina
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Effects of Intermittent Faults on the Reliability of a Reduced Instruction Set Computing (RISC) Microprocessor
by
Gracia-Moran, Joaquin
,
Baraza-Calvo, J. Carlos
,
Gil-Tomas, Daniel
,
Saiz-Adalid, Luis J.
,
Gil-Vicente, Pedro J.
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IEEE transactions on reliability
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Analyzing the Impact of Intermittent Faults on Microprocessors Applying Fault Injection
by
Gil-Tomas, D.
,
Gracia-Moran, J.
,
Baraza-Calvo, J-C
,
Saiz-Adalid, L-J
,
Gil-Vicente, P-J
Published in
IEEE design & test of computers
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Defining a Representative and Low Cost Fault Model Set for Intermittent Faults in Microprocessor Buses
by
Gracia-Moran, J.
,
Gil-Tomas, D.
,
Saiz-Adalid, L.
,
Baraza-Calvo, J.
,
Gil-Vicente, P.
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