Electrical Characterization of the Backside Interface on BSI Global Shutter Pixels with Tungsten-Shield Test Structures on CDTI Process by Doyen, Célestin, Ricq, Stéphane, Magnan, Pierre, Marcelot, Olivier, Barlas, Marios, Place, Sébastien

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Resistive RAM Endurance: Array-Level Characterization and Correction Techniques Targeting Deep Learning Applications by Grossi, Alessandro, Vianello, Elisa, Sabry, Mohamed M., Barlas, Marios, Grenouillet, Laurent, Coignus, Jean, Beigne, Edith, Wu, Tony, Le, Binh Q., Wootters, Mary K., Zambelli, Cristian, Nowak, Etienne, Mitra, Subhasish

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Co-Design of ReRAM Passive Crossbar Arrays Integrated in 180 nm CMOS Technology by Sandrini, Jury, Barlas, Marios, Thammasack, Maxime, Demirci, Tugba, De Marchi, Michele, Sacchetto, Davide, Gaillardon, Pierre-Emmanuel, De Micheli, Giovanni, Leblebici, Yusuf

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SMAD4 Loss in Colorectal Cancer Patients Correlates with Recurrence, Loss of Immune Infiltrate, and Chemoresistance by Wasserman, Isaac, Lee, Lik Hang, Ogino, Shuji, Marco, Michael R, Wu, Chao, Chen, Xi, Datta, Jashodeep, Sadot, Eran, Szeglin, Bryan, Guillem, Jose G, Paty, Philip B, Weiser, Martin R, Nash, Garrett M, Saltz, Leonard, Barlas, Afsar, Manova-Todorova, Katia, Uppada, Srijaya Prakash Babu, Elghouayel, Arthur E, Ntiamoah, Peter, Glickman, Jonathan N, Hamada, Tsuyoshi, Kosumi, Keisuke, Inamura, Kentaro, Chan, Andrew T, Nishihara, Reiko, Cercek, Andrea, Ganesh, Karuna, Kemeny, Nancy E, Dhawan, Punita, Yaeger, Rona, Sawyers, Charles L, Garcia-Aguilar, Julio, Giannakis, Marios, Shia, Jinru, Smith, J Joshua

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