Search Results - Barlingay, C. K.

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  1. 1
    Experimental study of the copper thiosulfate system with respect to thin-film deposition

    Experimental study of the copper thiosulfate system with respect to thin-film deposition by Grozdanov, I., Barlingay, C.K., Dey, S.K., Ristov, M., Najdoski, M.

    Published in Thin solid films
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  2. 2
    Observation of sol-gel solid phase epitaxial growth of ferroelectric Pb(Nb,Zr,Ti)O3 thin films on sapphire

    Observation of sol-gel solid phase epitaxial growth of ferroelectric Pb(Nb,Zr,Ti)O3 thin films on sapphire by BARLINGAY, C. K, DEY, S. K

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  3. 3
    Novel applications of chemically deposited CuxS thin films

    Novel applications of chemically deposited CuxS thin films by GROZDANOV, I, BARLINGAY, C. K, DEY, S. K

    Published in Materials letters
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  4. 4
    Dopant compensation mechanism and leakage current in Pb(Zr0.52, Ti0.48) O3 thin films

    Dopant compensation mechanism and leakage current in Pb(Zr0.52, Ti0.48) O3 thin films by BARLINGAY, C. K, DEY, S. K

    Published in Thin solid films
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  5. 5
    Structure evolution in the PbO-ZrO2-TiO2 sol-gel system: Part II?Pyrolysis of acid and base-catalyzed bulk and thin film gels

    Structure evolution in the PbO-ZrO2-TiO2 sol-gel system: Part II?Pyrolysis of acid and base-catalyzed bulk and thin film gels by Coffman, P. R., Barlingay, C. K., Gupta, A., Dey, S. K.

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  6. 6
    Dopant compensation mechanism and leakage current in Pb(Zr sub 0.52 ,Ti sub 0.48 )O sub 3 thin films

    Dopant compensation mechanism and leakage current in Pb(Zr sub 0.52 ,Ti sub 0.48 )O sub 3 thin films by Barlingay, C K, Dey, S K

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  7. 7
    Dopant compensation mechanism and leakage current in Pb(Zr 0.52,Ti 0.48)O 3 thin films

    Dopant compensation mechanism and leakage current in Pb(Zr 0.52,Ti 0.48)O 3 thin films by Barlingay, C.K., Dey, S.K.

    Published in Thin solid films
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  8. 8
    Novel applications of chemically deposited Cu sub x S thin films

    Novel applications of chemically deposited Cu sub x S thin films by Grozdanov, I, Barlingay, C K, Dey, S K

    Published in Materials letters
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  9. 9
    Mechanism of charge induced plasma damage to EPROM cells during fabrication of integrated circuits

    Mechanism of charge induced plasma damage to EPROM cells during fabrication of integrated circuits by Barlingay, C., Yach, R., Lukaszek, W.

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  10. 10
    Effect of reactive ion etching chemistry on plasma damage in EPROM cells

    Effect of reactive ion etching chemistry on plasma damage in EPROM cells by Barlingay, C.K., Yach, R., Lukaszek, W.

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  11. 11
    Advances in Processing and Properties of Perovskite Thin-Films for FRAMs, DRAMs, and Decoupling Capacitors

    Advances in Processing and Properties of Perovskite Thin-Films for FRAMs, DRAMs, and Decoupling Capacitors by Dey, S. K, Barlingay, C. K, Lee, J. J, Gloerstad, T. K, Suchicital, C. T

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