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    X-Ray-Interferometric Determination of Å-scale Lattice Shifts at the Surface of Silicon Crystals - the Analogue to Light-Optical Interference Microscopy

    X-Ray-Interferometric Determination of Å-scale Lattice Shifts at the Surface of Silicon Crystals - the Analogue to Light-Optical Interference Microscopy by Bartscher, Dr. M., Bonse, U.

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